TR8100 LV

Designed for testing large and complex PCBAs, the TR8100LV is TRI's top-of-the-line board test system targeting the low-voltage testing market. TR8100LV's vacuum system ensures full pin contact and with up to 3,584 pin digital MUX-free architecture, the system allows for faster and simpler testing of large pin-count devices and fast program development. Included *TRI ToggleScan® and VregTest® technology combine Boundary Scan with solutions for limited test access boards. *"ToggleScan®" and " VregTest®" are registered trademarks of Test Research, Inc.

Features
Specifications

Digital 1:1 driver/receiver per pin architecture design
High fault coverage test solution with vacuum fixture
Low voltage device testing and rapid test speed
Friendly UI with fast and easy program development

Tester Specifications

Analog/hybrid test points	TR8100LV: 3584 TR8100LLV: 5632
Operating System	Microsoft^® Windows compatible PC, Windows 10
Fixture Type	Offline press or vacuum type fixture

Standard Testing Components

Analog Test Hardware	6-wire measurement switching matrix Programmable AC/DC/DC High voltage and current sources AC/DC voltage, DC current measurement, frequency Component R/L/C measurement Synthesized Arbitrary Waveform Generator TestJet vectorless open circuit detection
Digital Testing	Non-multiplexing 1:1 per pin architecture with independent per-pin level setting DUT power supplies: 5 V@5 A, 3.3 V@5 A, 12 V@5A, 0.2~20 V@3 A and -3~-20 V@3 A On-board Flash, EEPROM, MAC programming

Optical Components

Analog Hardware	Fixture Conversion Kits for Teradyne, GenRad
Digital Testing	Programmable DUT power supplies: 75 V / 8 A, 200W maximum output power Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
Yield Management System	YMS 4.0

Dimensions

WxDxH	TR8100LV: 1150 x 850 x 800 mm TR8100LLV: 1550 x 850 x 800 mm
Weight	TR8100LV: 390 kg TR8100LLV: 450 kg

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