TR8100 LV

Designed for testing large and complex PCBAs, the TR8100LV is TRI's top-of-the-line board test system targeting the low-voltage testing market. TR8100LV's vacuum system ensures full pin contact and with up to 3,584 pin digital MUX-free architecture, the system allows for faster and simpler testing of large pin-count devices and fast program development. Included *TRI ToggleScan® and VregTest® technology combine Boundary Scan with solutions for limited test access boards. *"ToggleScan®" and " VregTest®" are registered trademarks of Test Research, Inc.

  • Digital 1:1 driver/receiver per pin architecture design
  • High fault coverage test solution with vacuum fixture
  • Low voltage device testing and rapid test speed
  • Friendly UI with fast and easy program development
Tester Specifications
Analog/hybrid test points TR8100LV: 3584
TR8100LLV: 5632
Operating System Microsoft® Windows compatible PC, Windows 10
Fixture Type Offline press or vacuum type fixture
Standard Testing Components
Analog Test Hardware
  • 6-wire measurement switching matrix
  • Programmable AC/DC/DC High voltage and current sources
  • AC/DC voltage, DC current measurement, frequency
  • Component R/L/C measurement
  • Synthesized Arbitrary Waveform Generator
  • TestJet vectorless open circuit detection
Digital Testing
  • Non-multiplexing 1:1 per pin architecture with independent per-pin level setting
  • DUT power supplies: 5 V@5 A, 3.3 V@5 A, 12 V@5A, 0.2~20 V@3 A and -3~-20 V@3 A
  • On-board Flash, EEPROM, MAC programming
Optical Components
Analog Hardware Fixture Conversion Kits for Teradyne, GenRad
Digital Testing
  • Programmable DUT power supplies: 75 V / 8 A,  200W maximum output power
  • Includes BScan Chain Test, BScan Cluster Test, BScan Virtual Nails Test, BScan Virtual Chain Test and IEEE1149.6 Test
Yield Management System YMS 4.0
WxDxH TR8100LV: 1150 x 850 x 800 mm
TR8100LLV: 1550 x 850 x 800 mm
Weight TR8100LV: 390 kg
TR8100LLV: 450 kg